Title :
High Voltage Testing of GIS: Application of Frequency Tuned Resonant Test Sets and Return of Experience from On-site Tests
Author :
Schichler, U. ; Wurster, M.
Author_Institution :
High Voltage Div., Siemens AG
Abstract :
This paper deals with the on-site testing of GIS at high test frequencies generated by frequency tuned resonant test sets. The application of test frequencies of up to 300 Hz (see IEC 62271-203) showed no dependency on the breakdown voltage of the GIS insulation system. The publication also describes modern frequency tuned resonant test sets which enable efficient on-site testing. The return of experience from on-site testing of a state-of-the-art 245 kV GIS population is summarized
Keywords :
gas insulated switchgear; insulation testing; switchgear testing; test equipment; tuning; 245 kV; GIS; GIS insulation system; IEC 62271-203; breakdown voltage; frequency tuned resonant test sets; high voltage testing; on-site tests; state-of-the-art; Circuit testing; Dielectrics; Frequency conversion; Geographic Information Systems; Impulse testing; Inductors; Resonance; Resonant frequency; System testing; Voltage;
Conference_Titel :
Properties and applications of Dielectric Materials, 2006. 8th International Conference on
Conference_Location :
Bali
Print_ISBN :
1-4244-0189-5
Electronic_ISBN :
1-4244-0190-9
DOI :
10.1109/ICPADM.2006.284175
