Discussion on Resistivity Testing Method of Semi-conducting screen in Power Cables

Author

Zhu, Yonghua ; Wu, Changshun ; Yin, Yi ; li, Zhe

Author_Institution

Testing & Inspection Station for Cable & Wire, Shanghai

fYear

2006

fDate

38869

Firstpage

368

Lastpage

371

Abstract

Since there is no specific description on the testing process in the Standards of IEC60502 and IEC60840 (Chinese corresponding Standards are GB/T12706-2002 and GB/T 11017-2002), which is on the testing method of semi-conducting screen in power cables, there exist more uncertainties in the resistivity testing result. To reasonably value the resistivity of semi-conducting screen, samples are prepared with domestic or foreign semi-conducting resin. The resistivity measurement is carried out by four-electrode method in the range of 293-393 K. It is shown that each sample made of domestic or foreign semi-conducting resin has a peak in the range of 353-373 K. In addition, the resistivity of samples varying with time is also studied in detail. It is shown that the resistivity decays slowly with time and runs to a quasi-constant value. Finally, the results are discussed and suggestion on test method of semi-conducting screen is proposed in this paper

Keywords

electrical resistivity; power cable testing; resins; 293 to 393 K; IEC60502 Standards; IEC60840 Standards; domestic resin; foreign semiconducting resin; four-electrode method; power cables; resistivity decays; resistivity testing method; semiconducting screen; Cable insulation; Conductivity; Electronic equipment testing; IEC standards; Manufacturing; Ovens; Power cables; Resins; Temperature; Trees - insulation; IEC60502; resistivity; semi-conducting screen;

fLanguage

English

Publisher

ieee

Conference_Titel

Properties and applications of Dielectric Materials, 2006. 8th International Conference on

Conference_Location

Bali

Print_ISBN

1-4244-0189-5

Electronic_ISBN

1-4244-0190-9

Type

conf

DOI

10.1109/ICPADM.2006.284192

Filename

4062681