DocumentCode
3248184
Title
Capacitor measurements for power electronic applications
Author
Strydom, J.T. ; van Wyk, J.D. ; Ferreira, J.A.
Author_Institution
Energy Lab., Rand Afrikaans Univ., Auckland Park, South Africa
Volume
4
fYear
1999
fDate
1999
Firstpage
2435
Abstract
Capacitors are utilised in a variety of different ways in power electronic circuits. Typical applications are in snubber, clamping and resonant circuits. For design purposes, it is necessary to make an accurate measurement of the actual behaviour of the capacitance that is added to the circuit under conditions related to those prevailing in a converter. For this purpose, a number of different measurement systems or techniques can be utilised. Four of these measurement systems are compared. These are small signal, variable frequency measurement, large signal quasi-DC measurement, in-situ high voltage measurement and small signal with large bias voltage measurement. Each of these measurement techniques returns characteristic values based on its particular model of the test capacitor. These tests are done on both ceramic and nonceramic capacitors at room temperature. The results are discussed
Keywords
capacitance measurement; electron device testing; power capacitors; power electronics; capacitance measurement; capacitor test measurements; ceramic capacitors; characteristic values; clamping circuits; in-situ high-voltage measurement; large-signal quasi-DC measurement; measurement systems; nonceramic capacitors; power electronic applications; resonant circuits; small-signal large-bias voltage measurement; small-signal variable-frequency measurement; snubber circuits; Capacitance measurement; Clamps; Frequency measurement; Power capacitors; Power electronics; Power measurement; RLC circuits; Snubbers; Testing; Voltage measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Industry Applications Conference, 1999. Thirty-Fourth IAS Annual Meeting. Conference Record of the 1999 IEEE
Conference_Location
Phoenix, AZ
ISSN
0197-2618
Print_ISBN
0-7803-5589-X
Type
conf
DOI
10.1109/IAS.1999.799182
Filename
799182
Link To Document