• DocumentCode
    3248184
  • Title

    Capacitor measurements for power electronic applications

  • Author

    Strydom, J.T. ; van Wyk, J.D. ; Ferreira, J.A.

  • Author_Institution
    Energy Lab., Rand Afrikaans Univ., Auckland Park, South Africa
  • Volume
    4
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    2435
  • Abstract
    Capacitors are utilised in a variety of different ways in power electronic circuits. Typical applications are in snubber, clamping and resonant circuits. For design purposes, it is necessary to make an accurate measurement of the actual behaviour of the capacitance that is added to the circuit under conditions related to those prevailing in a converter. For this purpose, a number of different measurement systems or techniques can be utilised. Four of these measurement systems are compared. These are small signal, variable frequency measurement, large signal quasi-DC measurement, in-situ high voltage measurement and small signal with large bias voltage measurement. Each of these measurement techniques returns characteristic values based on its particular model of the test capacitor. These tests are done on both ceramic and nonceramic capacitors at room temperature. The results are discussed
  • Keywords
    capacitance measurement; electron device testing; power capacitors; power electronics; capacitance measurement; capacitor test measurements; ceramic capacitors; characteristic values; clamping circuits; in-situ high-voltage measurement; large-signal quasi-DC measurement; measurement systems; nonceramic capacitors; power electronic applications; resonant circuits; small-signal large-bias voltage measurement; small-signal variable-frequency measurement; snubber circuits; Capacitance measurement; Clamps; Frequency measurement; Power capacitors; Power electronics; Power measurement; RLC circuits; Snubbers; Testing; Voltage measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industry Applications Conference, 1999. Thirty-Fourth IAS Annual Meeting. Conference Record of the 1999 IEEE
  • Conference_Location
    Phoenix, AZ
  • ISSN
    0197-2618
  • Print_ISBN
    0-7803-5589-X
  • Type

    conf

  • DOI
    10.1109/IAS.1999.799182
  • Filename
    799182