DocumentCode :
3248743
Title :
CT saturation calculations - are they applicable in the modern world? - Part III, low-ratio, high-current CT/microprocessor relay comparisons at a high-current testing laboratory
Author :
Cossé, Roy E., Jr. ; Dunn, Donald G. ; Spiewak, Robert M. ; Bowen, James E.
Author_Institution :
Chevron, Houston, TX
fYear :
2008
fDate :
22-24 Sept. 2008
Firstpage :
1
Lastpage :
14
Abstract :
Part III is an extension of the Part II testing effort, but with relay manufacturers providing, commissioning, and configuring the relays for the high-current test laboratory activities. Part III provides high-current testing laboratory results for multiple 50 kA and 63 kA tests involving several typical low-ratio switchgear CTpsilas (with typical burdens) and microprocessor feeder relay instantaneous 50 elements. Saturated low-ratio CT graphical waveform plots obtained from a series of tests are analyzed. Microprocessor relay 50 element true rms and bipolar peak detector relay filter algorithm types are considered. Discussions also include power system concerns resulting from delayed microprocessor relay instantaneous 50 element operation, i.e., arc flash PPE recommendations, relay coordination selectivity, equipment. Comments about electro-mechanical instantaneous relays are included.
Keywords :
current transformers; microprocessor chips; power distribution protection; power system relaying; power transformer protection; power transformers; relay protection; switchgear protection; switchgear testing; CT saturation calculation; bipolar peak detector relay filter algorithm; current 50 kA; current 63 kA; current transformer; electro-mechanical instantaneous relays; high-current CT/microprocessor feeder relay; high-current testing laboratory; low-ratio switchgear; power system relaying; Circuit faults; Detectors; Fault currents; Laboratories; Manufacturing; Microprocessors; Power system relaying; Relays; Switchgear; Testing; COMTRADE files; Current Transformers (CT); Digital Fault Recorder (DFR); Electromagnetic Transients Program (EMTP) Modeling; High-Current / Primary Injection testing; Intelligent Electronic Device (IED); Secondary Injection testing; Sequence of Event Record (SER);
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Petroleum and Chemical Industry Technical Conference, 2008. PCIC 2008. 55th IEEE
Conference_Location :
Cincinnati, OH
ISSN :
0090-3507
Print_ISBN :
978-1-4244-2520-4
Electronic_ISBN :
0090-3507
Type :
conf
DOI :
10.1109/PCICON.2008.4663966
Filename :
4663966
Link To Document :
بازگشت