• DocumentCode
    3248784
  • Title

    Lessons learned from generator tripping events at industrial facilities

  • Author

    Mozina, Charles J.

  • Author_Institution
    Beckwith Electr., Largo, FL
  • fYear
    2008
  • fDate
    22-24 Sept. 2008
  • Firstpage
    1
  • Lastpage
    8
  • Abstract
    This paper relates a number of generator tripping events that occurred within industrial plants in the hope that the ldquolessons learnedrdquo will help others avoid the events described. In many cases, these failures involved human errors and could have been avoided with proper generator protection or personnel training. In a number of cases, plant operators contributed or caused the events. These events were captured on oscillographs. The paper discusses the subtleties of analyzing generator non-fault events such as loss-of-field as well as the important role that sequence of event and oscillographic records play in analyzing these events. The paper also discusses the need to change the established practice of low-resistance grounding (200-400 A) of medium voltage industrial generators. In-service failures indicate the need to limit generator ground current to much lower levels to avoid catastrophic damage. The use of hybrid generator grounding is proposed as a solution to this problem.
  • Keywords
    earthing; electric generators; failure analysis; industrial plants; machine protection; oscillographs; current 200 A to 400 A; generator nonfault events; generator tripping events; hybrid generator grounding; industrial facilities; industrial plants; medium voltage industrial generators; oscillographs; Circuit faults; Costs; Fault currents; Grounding; Humans; Hybrid power systems; Industrial plants; Power generation; Protection; Stators; COMTRADE format; R-X diagrams; generator protection; hybrid grounding; loss-of-field; low resistance ground; oscillographs; overexcitaion;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Petroleum and Chemical Industry Technical Conference, 2008. PCIC 2008. 55th IEEE
  • Conference_Location
    Cincinnati, OH
  • ISSN
    0090-3507
  • Print_ISBN
    978-1-4244-2520-4
  • Electronic_ISBN
    0090-3507
  • Type

    conf

  • DOI
    10.1109/PCICON.2008.4663968
  • Filename
    4663968