Title :
Efficiency comparison of signature monitoring schemes for FSMs
Author :
Rochet, R. ; Leveugle, R. ; Saucier, G.
Author_Institution :
Inst. Nat. Polytech. de Grenoble, France
fDate :
29 Aug-1 Sep 1995
Abstract :
This paper addresses the detection of permanent and transient faults in complex VLSI circuits, with a particular focus on faults leading to sequencing errors. Several Finite State Machine implementations using signature monitoring for control-flow checking are compared in terms of error detection latency, theoretical error coverage, experimental error coverage and area overheads. Advantages and drawbacks of each approach are presented
Keywords :
finite state machines; logic testing; FSMs; control-flow checking; error coverage; error detection latency; sequencing error; signature monitoring; Automata; Circuit faults; Electrical fault detection; Error correction; Fault detection; Law; Legal factors; Monitoring; Performance analysis; Very large scale integration;
Conference_Titel :
Design Automation Conference, 1995. Proceedings of the ASP-DAC '95/CHDL '95/VLSI '95., IFIP International Conference on Hardware Description Languages. IFIP International Conference on Very Large Scal
Conference_Location :
Chiba
Print_ISBN :
4-930813-67-0
DOI :
10.1109/ASPDAC.1995.486391