DocumentCode
3249071
Title
Reliability testing for non-constant MTBFs
Author
Franck, James R.
Author_Institution
Digital Equipment Corp., Colorado Springs, CO, USA
fYear
1988
fDate
21-23 Mar 1988
Firstpage
232
Lastpage
234
Abstract
The mean time between failures (MTBF) of new products has been found to increase with time due to the decreasing number of process problems and design problems found as test time is accumulated. The author´s purpose is to show one method of considering this when developing a probability ratio sequential test plan (PRST). The method results in a shorter test time to an accept decision for a product with a high MTBF and a longer test time to a reject decision for a product with a low MTBF.
Keywords
failure analysis; reliability; testing; MTBF; PRST; accept; mean time between failures; new products; probability ratio sequential test; reject; reliability; test time; Equations; Process design; Sequential analysis; Springs; Testing; Weibull distribution;
fLanguage
English
Publisher
ieee
Conference_Titel
IEEE Region 5 Conference, 1988: 'Spanning the Peaks of Electrotechnology'
Type
conf
DOI
10.1109/REG5.1988.15937
Filename
15937
Link To Document