Title :
Discharge Characteristic of Phenolic Resin by Using Chaos theory
Author :
Dong, D.S. ; Du, B.X. ; Zhang, Xiangjin ; Zhu, Xiaohui
Author_Institution :
Sch of Electr. Eng. & Autom., Tianjin Univ.
Abstract :
A tracking failure text was carried out on phenolic resin (PL) in accordance with IEC60112. On the basis of chaos theory, the largest Lyapunov exponent was calculated, the correlation dimension was estimated and the 2-dimensional attractor of discharge current was reconstructed, which all produced the evidence that there existed chaotic behavior in the discharge current. The correlation dimension of different applied voltage levels was also estimated. Obtained results indicate that the correlation dimension increases notably with increasing the applied voltage. The evolution of correlation dimension for same voltage level was given. The value of correlation dimension is divided into three sections as the text processes, which consists well with the fact of tracking failure process
Keywords :
Lyapunov methods; chaos; discharges (electric); polymers; resins; 2-dimensional chaos attractor; IEC60112; Lyapunov exponent; chaos theory; discharge characteristics; discharge current; phenolic resin; tracking failure process; Chaos; Delay; Dielectric breakdown; Fractals; Insulation life; Polymers; Resins; Surface discharges; Testing; Voltage;
Conference_Titel :
Properties and applications of Dielectric Materials, 2006. 8th International Conference on
Conference_Location :
Bali
Print_ISBN :
1-4244-0189-5
Electronic_ISBN :
1-4244-0190-9
DOI :
10.1109/ICPADM.2006.284237