• DocumentCode
    3249724
  • Title

    Description of the DC behavior of aging phenomena in winding insulating systems

  • Author

    Busch, Rudolf ; Wang, Hongyu

  • Author_Institution
    The 12th Dept./Electr. Eng., Essen Univ., Germany
  • Volume
    2
  • fYear
    1996
  • fDate
    20-23 Oct 1996
  • Firstpage
    860
  • Abstract
    This paper presents a new model for the description of the DC behavior of aging phenomena in low voltage winding insulating systems. In this model the concerned aging phenomena are described by the postcharge-index, the initial up-current-index, the first-peak-time, and some other related indices, which are defined in this paper. The theoretical inferences of the DC behavior model to aging phenomena have been verified with the experimental results, which are obtained by a so called “Reverse-drive” aging test with rotating machines. The result of the research verifies that dielectric polarization plays an important role in the aging progression of low voltage winding insulating systems. It indicates also that the aging-state of winding insulating systems can be practically supervised by means of this description method for the DC behavior. This model can be used as an active tool for the estimation of the aging-state and fault prognosis for low voltage winding insulating systems
  • Keywords
    ageing; dielectric polarisation; equivalent circuits; failure analysis; insulation testing; machine insulation; machine testing; machine windings; DC behavior; LV insulation; aging phenomena; dielectric polarization; fault prognosis; first-peak-time; initial up-current-index; low voltage winding insulation; model; postcharge-index; reverse-drive aging test; rotating machines; winding insulating systems; Aging; Breakdown voltage; Cable insulation; Dielectrics and electrical insulation; Insulation testing; Low voltage; Machine windings; Polarization; System testing; Thermal stresses;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation and Dielectric Phenomena, 1996., IEEE 1996 Annual Report of the Conference on
  • Conference_Location
    Millbrae, CA
  • Print_ISBN
    0-7803-3580-5
  • Type

    conf

  • DOI
    10.1109/CEIDP.1996.564643
  • Filename
    564643