• DocumentCode
    3249936
  • Title

    Experimental and simulated generation of bandlimited noise for communication system bit error rate evaluation

  • Author

    Miller, Damon A. ; Bazuin, Bradley ; Lillrose, Jason ; Tamayo, Paolo ; Grassi, Giuseppe

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Western Michigan Univ., Kalamazoo, MI, USA
  • fYear
    2005
  • fDate
    7-10 Aug. 2005
  • Firstpage
    139
  • Abstract
    This paper describes an inexpensive approach to experimentally measure and simulate low frequency communication system bit error rates (BERs). A readily constructed bandlimited noise source and a programmable logic based BER test unit enable experimental BER measurements. A technique proposed by Beaulieu and Tan (1999) is used to generate noise samples based on the bandlimited noise source power spectrum. These noise samples are then used to obtain simulated BER curves for comparison and validation of experimental BER curves. This paper includes an example of using the proposed approach to measure the BER performance of a coherent communication system. Initial results demonstrate the utility of this approach.
  • Keywords
    bandlimited communication; error statistics; noise generators; phase shift keying; BER measurements; bandlimited noise generation; bit error rate evaluation; coherent communication system; low frequency communication system; programmable logic; Binary phase shift keying; Bit error rate; Circuit noise; Communication systems; Computational modeling; Low-frequency noise; Noise generators; Noise measurement; Noise shaping; Oscillators;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 2005. 48th Midwest Symposium on
  • Print_ISBN
    0-7803-9197-7
  • Type

    conf

  • DOI
    10.1109/MWSCAS.2005.1594058
  • Filename
    1594058