DocumentCode
3249936
Title
Experimental and simulated generation of bandlimited noise for communication system bit error rate evaluation
Author
Miller, Damon A. ; Bazuin, Bradley ; Lillrose, Jason ; Tamayo, Paolo ; Grassi, Giuseppe
Author_Institution
Dept. of Electr. & Comput. Eng., Western Michigan Univ., Kalamazoo, MI, USA
fYear
2005
fDate
7-10 Aug. 2005
Firstpage
139
Abstract
This paper describes an inexpensive approach to experimentally measure and simulate low frequency communication system bit error rates (BERs). A readily constructed bandlimited noise source and a programmable logic based BER test unit enable experimental BER measurements. A technique proposed by Beaulieu and Tan (1999) is used to generate noise samples based on the bandlimited noise source power spectrum. These noise samples are then used to obtain simulated BER curves for comparison and validation of experimental BER curves. This paper includes an example of using the proposed approach to measure the BER performance of a coherent communication system. Initial results demonstrate the utility of this approach.
Keywords
bandlimited communication; error statistics; noise generators; phase shift keying; BER measurements; bandlimited noise generation; bit error rate evaluation; coherent communication system; low frequency communication system; programmable logic; Binary phase shift keying; Bit error rate; Circuit noise; Communication systems; Computational modeling; Low-frequency noise; Noise generators; Noise measurement; Noise shaping; Oscillators;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems, 2005. 48th Midwest Symposium on
Print_ISBN
0-7803-9197-7
Type
conf
DOI
10.1109/MWSCAS.2005.1594058
Filename
1594058
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