Large scale testing of switching speeds of junction transistors

This paper describes a method of rapidly evaluating the switching speed of transistors by means of a fully automatic tester suitable for factory use. A transistor may be plugged into the tester and after a brief settling time, a voltage proportional to the expected switching speed appears on a meter or permanent recording device. Because of the non-linear nature of transistors, the test is restricted by the necessity for making the measurement using a circuit configuration resembling that of the intended application.