• DocumentCode
    3250181
  • Title

    Multi-resolution simulation of PWM Dc-Dc converters

  • Author

    Davoudi, Ali ; Chapman, Patrick L. ; Jatskevich, Juri

  • Author_Institution
    Univ. of Illinois at Urbana-Champaign, Urbana, IL
  • fYear
    2008
  • fDate
    14-18 Sept. 2008
  • Firstpage
    1
  • Lastpage
    7
  • Abstract
    Multi-resolution simulation offers rapid simulation of power electronics converters from very general to very detailed consideration. An approach for multi-rate simulation of switched linear system is considered here. A detailed full-order model of the converter is built that appropriately includes the system parasitic, switching nonlinearity, and switching event detection. Numerically-rigorous order-reduction techniques are then used to extract a lower-order model for the desired simulation resolution. The simulation resolution can be adjusted on the user discretion, even during simulation run. The state continuity across different resolutions and switching events is ensured using appropriate similarity transforms. This methodology can also be used for accelerated steady-state solution of fast state variables. The proposed methodology is demonstrated on a boost converter in frequency- and time-domains.
  • Keywords
    DC-DC power convertors; PWM power convertors; switching convertors; time-frequency analysis; PWM DC-DC converters; boost converter; converter full-order model; frequency-and time-domains analysis; multiresolution simulation; numerically-rigorous order-reduction techniques; power electronics converters; simulation resolution; steady-state solution; switched linear system; Acceleration; DC-DC power converters; Event detection; Linear systems; Power electronics; Power system modeling; Pulse width modulation; Pulse width modulation converters; Steady-state; Switching converters;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Telecommunications Energy Conference, 2008. INTELEC 2008. IEEE 30th International
  • Conference_Location
    San Diego, CA
  • Print_ISBN
    978-1-4244-2055-1
  • Electronic_ISBN
    978-1-4244-2056-8
  • Type

    conf

  • DOI
    10.1109/INTLEC.2008.4664044
  • Filename
    4664044