Title :
Minimization of secondary effects in SOI: a 32-bit ANT logic adder implementation
Author :
Wasson, Sameer ; Sanghvi, Dipti ; Nunez, Adrián
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Syracuse Univ., NY
Abstract :
This paper presents a review of circuit design techniques related to silicon on insulator technology (SOI) CMOS circuits. The most important design considerations are parasitic bipolar effect, floating body effect and hysteric variation in the threshold voltage. These effects lead to the reduction of the noise margin and under serious circumstances may lead to a wrong output. Dynamic circuits are most vulnerable to these effects due to the presence of a soft node at the top of the pull down stack. We have studied the various existing techniques and have proposed a design modification which alleviates the floating body effect without compromising other parameters like speed and without penalizing the charge sharing present. The approach is based on adding an extra transistor which will minimize the floating body effect without worsening charge sharing. The effectiveness of our design technique is demonstrated through its implementation in a 32-bit ANT logic carry look ahead adder using BSIMSOI models. Results show that the performance of the modified circuit is reliable and minimizes the floating body effect without adversely affecting charge sharing
Keywords :
CMOS logic circuits; adders; integrated circuit design; logic design; silicon-on-insulator; 32 bit; ANT logic adder implementation; BSIMSOI models; CMOS circuits; SOI; charge sharing; circuit design techniques; floating body effect; parasitic bipolar effect; pull down stack; silicon on insulator technology; threshold voltage hysteric variation; Adders; CMOS logic circuits; CMOS technology; Circuit noise; Circuit synthesis; Logic design; Minimization; Noise reduction; Silicon on insulator technology; Threshold voltage;
Conference_Titel :
Circuits and Systems, 2005. 48th Midwest Symposium on
Conference_Location :
Covington, KY
Print_ISBN :
0-7803-9197-7
DOI :
10.1109/MWSCAS.2005.1594082