DocumentCode :
3250458
Title :
Preparation and Characterization of TiO2-Hybrid SiO2 Porous Film
Author :
Liu, Qiang ; Zhu, Zhong-Qi ; Zhang, Jin ; Liu, Qing-Ju ; Chen, Juan
Author_Institution :
Yunnan Key Lab. of Nanomater. & Nanotechnol., Yunnan Univ., Kunming, China
fYear :
2009
fDate :
14-16 Aug. 2009
Firstpage :
1
Lastpage :
4
Abstract :
Porous silicon films are currently under intense investigation for optical, photoelectric, thermal and electronic applications. In this work, the silica films have been prepared by a sol-gel process using a CTAB template. As an improvement, TiO2 was doped in silica sol to produce the TiO2-hybrid SiO2 Porous Film, and the hydrophobic activation of the film was carried out. The chemical and physical changes during sol-gel process were analyzed using DSC-TGA and FTIR. The structure and morphology of films were characterized by XRD and AFM. The experimental results show that the fabricated films have a nano-porous structure. The porous silica film (mean pore size 50 nm) is about 500 nm thick. The mechanical reliability of the film is well, and the contact angle of film is above 90deg after hydrophobic activation.
Keywords :
X-ray diffraction; atomic force microscopy; hydrophobicity; porous semiconductors; silicon compounds; sol-gel processing; titanium compounds; AFM; CTAB template; TiO2-SiO2; XRD; hybrid porous film; hydrophobic activation; mechanical reliability; sol-gel process; Chemical analysis; Chemical processes; Ethanol; Optical films; Optical refraction; Optical variables control; Semiconductor films; Silicon compounds; Size control; Substrates;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photonics and Optoelectronics, 2009. SOPO 2009. Symposium on
Conference_Location :
Wuhan
Print_ISBN :
978-1-4244-4412-0
Type :
conf
DOI :
10.1109/SOPO.2009.5230091
Filename :
5230091
Link To Document :
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