Title :
Photo-BJMOSFET Based on SOI Film and Its Analytical Compact Model
Author :
Xie, Hai-Qing ; Zeng, Yun ; Zeng, Jian-Ping ; Zhang, Guo-Liang ; Wang, Tai-Hong
Author_Institution :
Sch. of Phys. & Microelectron. Sci., Hunan Univ., Changsha, China
Abstract :
A novel photoelectric device-photo-BJMOSFET (Bipolar Junction Metal-Oxide-Semiconductor Field Effect Transistor) fabricated on SOI film was proposed in this paper. The photo-BJMOSFET operates in the depletion but not inversion region to decrease dark current. Due to two kinds of carriers (electron and hole) in this device, it is more sensitive than the conventional MOS structure under the same operating conditions and structure parameters. Numerical calculation of the analytical model indicates that photo-BJMOSFET has high sensitivity and SNR (Signal to Noise Ratio). In addition, it can eliminate the high dark current of PN junction under CMOS process, and promise compatibility with CMOS process.
Keywords :
MOSFET; photoelectric devices; semiconductor device models; silicon-on-insulator; CMOS process; MOS structure; SOI film; analytical compact model; bipolar junction metal-oxide-semiconductor field effect transistor; dark current; depletion region; photoelectric device-photo-BJMOSFET; photosensitivity; Analytical models; CMOS process; Dark current; Frequency; Gratings; MOSFETs; Microelectronics; Optical films; Semiconductor device noise; Signal to noise ratio;
Conference_Titel :
Photonics and Optoelectronics, 2009. SOPO 2009. Symposium on
Conference_Location :
Wuhan
Print_ISBN :
978-1-4244-4412-0
DOI :
10.1109/SOPO.2009.5230093