Title :
Study on the Microstructure and Ferroelectricity of Sr0.5Ba0.5-x Bix TiO3 Thin Films
Author :
Lianwei, Shan ; Xiaohong, Zhang ; Limin, Dong ; Ze, Wu ; Zhidong, Han ; Xianyou, Zhang
Author_Institution :
Dept. of Mater. & Eng., Haerbin Univ. of Sci. & Technol.
Abstract :
The influences of bismuth (Bi) on the microstructure and ferroelectricity of Sr0.5Ba0.5-x BixTiO3 (BST) thin films were studied. The Pr, Ps and Ec was 0.22¿C/cm2, 0.72¿C/cm2 and 60Kv/cm respectively for Sr0.5Ba0.485Bi0.015TiO3 thin film at 100Hz, 20V. The microstructure and phase analyses of BST thin films were examined by XRD, FTIR and TEM. The results show that tetragonal perovskite crystal grains existed in BST thin films. Moreover the grain size was decreased with the increasing Bi3+ doping ration.
Keywords :
Fourier transform spectra; X-ray diffraction; barium compounds; bismuth compounds; doping; ferroelectric thin films; ferroelectricity; grain size; infrared spectra; strontium compounds; transmission electron microscopy; 100 Hz; 20 V; BST thin films; Bi3+ doping ration; FTIR; Sr0.5Ba0.5-xBixTiO3; TEM; XRD; bismuth; ferroelectricity; grain size; microstructure; phase analyses; tetragonal perovskite crystal grains; Barium; Binary search trees; Bismuth; Dielectric thin films; Doping; Ferroelectric materials; Infrared heating; Microstructure; Transistors; X-ray scattering;
Conference_Titel :
Properties and applications of Dielectric Materials, 2006. 8th International Conference on
Conference_Location :
Bali, Indonesia
Print_ISBN :
1-4244-0189-5
Electronic_ISBN :
1-4244-0190-9
DOI :
10.1109/ICPADM.2006.284301
