DocumentCode :
3250579
Title :
Optimization of step stress accelerated degradation test plans
Author :
Zhang, Jing-Rui ; Jiang, Tong-Min ; Li, Xiao-Yang ; Wang, Li-Zhi
Author_Institution :
Sch. of Reliability & Syst. Eng., Beihang Univ., Beijing, China
fYear :
2010
fDate :
29-31 Oct. 2010
Firstpage :
947
Lastpage :
951
Abstract :
In the reliability prediction of the product with long life and high reliability, the step stress accelerated degradation test (SSADT) is commonly applied. With the motivation of predicting the product reliability most precisely, the problem of optimizing the test plans has drawn a lot of attentions in the application of SSADT. In this paper, the drift Brownian motion is selected as the degradation model. And in order to minimize the mean square error (MSE) of the prediction of the product operation reliability, the test plans of a SSADT that under the specified total test time and sample size are optimized through a Monte Carlo simulation method. At last, in combination with the sensitive analysis, the robust optimal test plans are obtained.
Keywords :
Monte Carlo methods; internal stresses; life testing; mean square error methods; mechanical testing; optimisation; reliability; Monte Carlo simulation; drift Brownian motion; mean square error; opimization; product operation reliability; step stress accelerated degradation test plans; Acceleration; Biological system modeling; Computational modeling; Degradation; Robustness; SONOS devices; Silicon; Accelerated degradation test; optimal design; sensitive analysis; simulation; step stress;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industrial Engineering and Engineering Management (IE&EM), 2010 IEEE 17Th International Conference on
Conference_Location :
Xiamen
Print_ISBN :
978-1-4244-6483-8
Type :
conf
DOI :
10.1109/ICIEEM.2010.5646470
Filename :
5646470
Link To Document :
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