The instability and reliability of silicon field emission array

IS can be classified into four components according to the four types of the time duration observed in a current-time plot. In this paper, we will explicate these components and the possible mechanism responsible for each component. Stability and reliability are two critical parameters when a field emission cathode (FEC) is to be used in a practical device and accepted by the public. These parameters are connected to each other and so it is better to consider them as a whole and begin from the relatively attainable IS property.