DocumentCode
3250915
Title
Generating small combinatorial test suites to cover input-output relationships
Author
Cheng, Christine ; Dumitrescu, Adrian ; Schroeder, Patrick
Author_Institution
Dept. of Comput. Sci., Univ. of Wisconsin-Milwaukee, Milwaukee, WI, USA
fYear
2003
fDate
6-7 Nov. 2003
Firstpage
76
Lastpage
82
Abstract
In this paper, we consider a problem that arises in black box testing: generating small test suites (i.e., sets of test cases) where the combinations that have to be covered are specified by input-output parameter relationships of a software system. That is, we only consider combinations of input parameters that affect an output parameter. We also do not assume that the input parameters have the same number of values. To solve this problem, we revisit the greedy algorithm for test generation and show that the size of the test suite it generates is within a logarithmic factor of the optimal. Unfortunately, the algorithm´s main weaknesses are its time and space requirements for construction. To address this issue, we present a problem reduction technique that makes the greedy algorithm or any other test suite generation method more efficient if the reduction in size is significant.
Keywords
program testing; software maintenance; software performance evaluation; software reliability; black box testing; combinatorial test suite; construction space requirement; construction time requirement; greedy algorithm; input parameter; input-output relationships; optimal logarithmic factor; output parameter; problem reduction; small test suite; software system; test case set; test suite generation; Application software; Computer science; Costs; Greedy algorithms; NIST; Performance evaluation; Software engineering; Software systems; Software testing; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Quality Software, 2003. Proceedings. Third International Conference on
Print_ISBN
0-7695-2015-4
Type
conf
DOI
10.1109/QSIC.2003.1319088
Filename
1319088
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