DocumentCode
3250929
Title
The use of extracted BSIM3v3 MOS parameters for fast design of circuits on weak inversion
Author
De Carvalho Ferreira, L.H. ; Pimenta, Tales Cleber
Author_Institution
Univ. Fed. de Itajuba, Brazil
fYear
2004
fDate
6-8 Dec. 2004
Firstpage
84
Lastpage
87
Abstract
This work describes a methodology for the extraction of DC parameters of MOS transistors on weak inversion from BSIM3v3 model. Once the optimum model for manual calculations has been defined, the parameters are obtained using the minimum square method. The results show that the proposed method improves the precision of the transistors ´dimensions´ calculations, by giving a determination index r3 to the I vs V relation, which is 99.31% of the worst case, when compared to the BSIM3v3.
Keywords
MOSFET; mean square error methods; network synthesis; semiconductor device models; BSIM3v3 model; DC parameter extraction; MOS transistors; circuit design; minimum square method; weak inversion; CMOS technology; Circuits; Equations; Extraterrestrial measurements; Foundries; MOSFETs; SPICE; Semiconductor device modeling; Signal design; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Microelectronics, 2004. ICM 2004 Proceedings. The 16th International Conference on
Print_ISBN
0-7803-8656-6
Type
conf
DOI
10.1109/ICM.2004.1434212
Filename
1434212
Link To Document