• DocumentCode
    3250980
  • Title

    Ensemble modeling through multiplicative adjustment of class probability

  • Author

    Hong, Se June ; Hosking, Jonathan ; Natarajan, Ramesh

  • Author_Institution
    IBM T. J. Watson Res. Center, Yorktown Heights, NY, USA
  • fYear
    2002
  • fDate
    2002
  • Firstpage
    621
  • Lastpage
    624
  • Abstract
    We develop a new concept for aggregating items of evidence for class probability estimation. In Naive Bayes, each feature contributes an independent multiplicative factor to the estimated class probability. We modify this model to include an exponent in each factor in order to introduce feature importance. These exponents are chosen to maximize the accuracy of estimated class probabilities on the training data. For Naive Bayes, this modification accomplishes more than what feature selection can. More generally, since the individual features can be the outputs of separate probability models, this yields a new ensemble modeling approach, which we call APM (Adjusted Probability Model), along with a regularized version called APMR.
  • Keywords
    Bayes methods; data mining; learning (artificial intelligence); probability; very large databases; APMR; Adjusted Probability Model; Naive Bayes; UCI dataset; class probability estimation; data mining; ensemble modeling; feature importance; machine learning data set; multiplicative adjustment; training data; Additives; Bagging; Boosting; Electronic mail; Logistics; Niobium; Parameter estimation; Predictive models; Sections; Yield estimation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Data Mining, 2002. ICDM 2003. Proceedings. 2002 IEEE International Conference on
  • Print_ISBN
    0-7695-1754-4
  • Type

    conf

  • DOI
    10.1109/ICDM.2002.1184013
  • Filename
    1184013