DocumentCode
3250980
Title
Ensemble modeling through multiplicative adjustment of class probability
Author
Hong, Se June ; Hosking, Jonathan ; Natarajan, Ramesh
Author_Institution
IBM T. J. Watson Res. Center, Yorktown Heights, NY, USA
fYear
2002
fDate
2002
Firstpage
621
Lastpage
624
Abstract
We develop a new concept for aggregating items of evidence for class probability estimation. In Naive Bayes, each feature contributes an independent multiplicative factor to the estimated class probability. We modify this model to include an exponent in each factor in order to introduce feature importance. These exponents are chosen to maximize the accuracy of estimated class probabilities on the training data. For Naive Bayes, this modification accomplishes more than what feature selection can. More generally, since the individual features can be the outputs of separate probability models, this yields a new ensemble modeling approach, which we call APM (Adjusted Probability Model), along with a regularized version called APMR.
Keywords
Bayes methods; data mining; learning (artificial intelligence); probability; very large databases; APMR; Adjusted Probability Model; Naive Bayes; UCI dataset; class probability estimation; data mining; ensemble modeling; feature importance; machine learning data set; multiplicative adjustment; training data; Additives; Bagging; Boosting; Electronic mail; Logistics; Niobium; Parameter estimation; Predictive models; Sections; Yield estimation;
fLanguage
English
Publisher
ieee
Conference_Titel
Data Mining, 2002. ICDM 2003. Proceedings. 2002 IEEE International Conference on
Print_ISBN
0-7695-1754-4
Type
conf
DOI
10.1109/ICDM.2002.1184013
Filename
1184013
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