• DocumentCode
    3250989
  • Title

    Estimation of repeatability and between-method reproducibility using a novel statistical model

  • Author

    Chen, MingNan ; Lyu, Jung, Jr.

  • Author_Institution
    Dept. of Manage. & Inf., Nan Jeon Inst. of Technol., Tainan, Taiwan
  • fYear
    2010
  • fDate
    29-31 Oct. 2010
  • Firstpage
    857
  • Lastpage
    861
  • Abstract
    Measurement uncertainty is used to describe the quality of a measurement value and ensures the ability of a laboratory to reliably implement quality improvement initiatives. The repeatability and reproducibility (R&R) study is the program most widely used to assess measurement uncertainty. R&R study is based on the assumption of a normal probability distribution of measurement results. However, standard R&R methods are inadequate for evaluating measurement uncertainty in numerous situations involving an insufficiently realistic normality assumption. This study proposes a statistical model for determining the R&R variance for inter-laboratory measurement results. The Expectation Maximization (E-M) algorithm and generalized linear model (GLM) are applied to estimate the repeatability variance, and a developed method is designed for estimating inter-laboratory and reproducibility variance. The findings are employed to evaluate and improve measurement uncertainty in laboratory accreditation.
  • Keywords
    measurement uncertainty; normal distribution; optimisation; quality management; between-method reproducibility; expectation maximization algorithm; generalized linear model; interlaboratory measurement; measurement uncertainty; measurement value; normal probability distribution; quality improvement; repeatability estimation; repeatability variance; reproducibility variance; Digital video broadcasting; Measurement uncertainty; Uncertainty; ISO; Measurement uncertainty; repeatability; reproducibility;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Engineering and Engineering Management (IE&EM), 2010 IEEE 17Th International Conference on
  • Conference_Location
    Xiamen
  • Print_ISBN
    978-1-4244-6483-8
  • Type

    conf

  • DOI
    10.1109/ICIEEM.2010.5646487
  • Filename
    5646487