• DocumentCode
    3251317
  • Title

    Improved AC immunity of ground fault protection in span power systems

  • Author

    Babineau, John ; Moschopoulos, Gerry

  • Author_Institution
    Emerson Network Power Canada, St. Thomas, ON
  • fYear
    2008
  • fDate
    14-18 Sept. 2008
  • Firstpage
    1
  • Lastpage
    7
  • Abstract
    The past decade has seen a resurgence in span powering with the proliferation of broadband services. Span powering offers an economical method to power a variety of DSL equipment over large distances from the central office (CO). The reach of span power has increased in recent years with the acceptance of new 200 Vdc limits. However, in order to take advantage of this higher voltage level, reliable DC ground fault protection must now be provided. The twisted copper pair wires used to deliver the span voltage are often in close proximity to power transmission lines. Power line interference can be induced onto the telephone lines resulting in an unwanted common mode AC noise. Small DC ground fault currents become difficult to measure in the presence of these induced AC currents. This paper will discuss an adaptive filtering approach, based on the LMS algorithm, to eliminate the unwanted interference. Guidelines from Telcordia GR-1089-Core, chapter 5 will be used to evaluate the effectiveness of the adaptive filter.
  • Keywords
    earthing; interference suppression; least mean squares methods; power transmission faults; power transmission protection; telecommunication transmission lines; DC ground fault protection reliability; DSL equipment; LMS algorithm; broadband services; economical method; ground fault protection; improved AC immunity; power line interference; power transmission lines; span power systems; Adaptive filters; Central office; Copper; DSL; Power generation economics; Power system economics; Power system faults; Power system protection; Voltage; Wires;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Telecommunications Energy Conference, 2008. INTELEC 2008. IEEE 30th International
  • Conference_Location
    San Diego, CA
  • Print_ISBN
    978-1-4244-2055-1
  • Electronic_ISBN
    978-1-4244-2056-8
  • Type

    conf

  • DOI
    10.1109/INTLEC.2008.4664101
  • Filename
    4664101