• DocumentCode
    3251450
  • Title

    Fabrication of silicon field emitter by forming porous silicon

  • Author

    Donghwan Kim ; Sang Jik Kwon ; Jong Duk Lee ; Won, J.H.

  • Author_Institution
    Dept. of Electron. Eng., Seoul Nat. Univ., South Korea
  • fYear
    1995
  • fDate
    July 30 1995-Aug. 3 1995
  • Firstpage
    176
  • Lastpage
    180
  • Abstract
    Silicon field emitter array has been fabricated using porous silicon formation in HF solution. Porous silicon layers are formed on n-type silicon wafer with n/sup +/ layer and p-type silicon wafer in order to make tips. Then, the porous silicon layer is thermally oxidized to be used as an insulator between the gate metal and the silicon substrate. The anode currents of 130 nA per tip and 1 nA per tip are obtained at a gate voltage of 100 V for the n-type emitter and the p-type emitter, respectively. The gate current is less than 0.5% of the anode current for both types.
  • Keywords
    electron field emission; elemental semiconductors; etching; oxidation; porous materials; semiconductor technology; silicon; vacuum microelectronics; 1 nA; 100 V; 130 nA; HF; HF solution; Si; Si field emitter array; Si-SiO/sub 2/; field emitter fabrication; n-type Si wafer; n-type emitter; n/sup +/ layer; p-type Si wafer; p-type emitter; porous Si formation; porous semiconductor; thermal oxidation; Anodes; Current density; Etching; Fabrication; Field emitter arrays; Hafnium; Insulation; Leakage current; Silicon; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vacuum Microelectronics Conference, 1995. IVMC., 1995 International
  • Conference_Location
    Portland, OR, USA
  • Print_ISBN
    0-7803-2143-X
  • Type

    conf

  • DOI
    10.1109/IVMC.1995.487019
  • Filename
    487019