• DocumentCode
    3251839
  • Title

    Statistical model of cathodes with limited emissive resource

  • Author

    Golubentsev, A.F. ; Anikin, V.M.

  • Author_Institution
    Dept. of Phys., Saratov State Univ., Russia
  • fYear
    1995
  • fDate
    July 30 1995-Aug. 3 1995
  • Firstpage
    238
  • Lastpage
    241
  • Abstract
    The Markov probabilistic model of emissive fluctuations and degradation for an emissive area with the "limited emissive resource" is presented. The relationships between characteristics of the emissive fluctuations and the reliability for such an emitter are obtained.
  • Keywords
    Markov processes; cathodes; electron emission; Markov probabilistic model; cathodes; degradation; emissive fluctuations; limited emissive resource; reliability; statistical model; Cathodes; Degradation; Electron emission; Equations; Fluctuations; Physics; Probability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vacuum Microelectronics Conference, 1995. IVMC., 1995 International
  • Conference_Location
    Portland, OR, USA
  • Print_ISBN
    0-7803-2143-X
  • Type

    conf

  • DOI
    10.1109/IVMC.1995.487035
  • Filename
    487035