Title :
The spatial dispersion of the electric field for field emission microtriodes
Author_Institution :
Res. Inst. for Electron. Components, Bucharest, Romania
fDate :
July 30 1995-Aug. 3 1995
Abstract :
The spatial dispersion of the electric field on the emitter is studied for field emission microtriodes (FEMTs). An analytical two-dimensional FEMT model is developed. It is shown that the electric field on the emitter as a function of the angular position E(/spl phi/) is obtained as a sum of an "anode" field term E/sub a/(/spl phi/) and a "gate" field term E/sub g/(/spl phi/). The anode term has a maximal value located on the emitter apex. For the gate placed far away from the emitter, the gate term E/sub g/(/spl phi/) has a maximum on the emitter apex, like E/sub a/(/spl phi/). For small emitter-gate distances, E/sub g/(/spl phi/) has a lateral maximum. The resulting field distribution E(/spl phi/) depends on the relative magnitude of the anode gate voltages and the geometry of the system. These features are further studied considering a three-dimensional FEMT numerical model. The emitter has a conical body with spherical tip and a plane gate. The emission current is obtained using the standard Fowler-Nordheim relationship and integrating the current density over the emitter surface. The anode I/sub a/ and gate I/sub g/ currents are computed assuming a simple model for the trajectories of the emitted electrons. The spatial field dispersion E(/spl phi/) and the current ratio I/sub a/ I/sub g/ are outlined as a function of model parameters.
Keywords :
electron field emission; triodes; vacuum microelectronics; Fowler-Nordheim equation; current ratio; electric field; field emission microtriode; spatial dispersion; three-dimensional numerical model; tow-dimensional analytical model; Analytical models; Anodes; Current density; Diodes; Electrodes; Electronic components; Numerical models; Positrons; Voltage;
Conference_Titel :
Vacuum Microelectronics Conference, 1995. IVMC., 1995 International
Conference_Location :
Portland, OR, USA
Print_ISBN :
0-7803-2143-X
DOI :
10.1109/IVMC.1995.487036