DocumentCode :
3251867
Title :
Analysis of vacuum microelectronic components by the use of special finite elements
Author :
Kopka, P. ; Ermert, H.
Author_Institution :
Dept. of Electr. Eng., Ruhr-Univ., Bochum, Germany
fYear :
1995
fDate :
July 30 1995-Aug. 3 1995
Firstpage :
247
Lastpage :
251
Abstract :
For vacuum microelectronic devices special finite elements have been introduced which are able to describe field enhancements near cone emitters with small radius of emitter curvature in an effective way. Compared to conventional methods, simulations using these elements can be carried out more precisely and with less computer time and storage.
Keywords :
finite element analysis; vacuum microelectronics; cone emitters; electric field enhancement; finite element simulation; vacuum microelectronic devices; Anodes; Computational modeling; Computer simulation; Diodes; Electron emission; Electron tubes; Electrostatic analysis; Finite element methods; Laplace equations; Microelectronics;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Vacuum Microelectronics Conference, 1995. IVMC., 1995 International
Conference_Location :
Portland, OR, USA
Print_ISBN :
0-7803-2143-X
Type :
conf
DOI :
10.1109/IVMC.1995.487037
Filename :
487037
Link To Document :
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