DocumentCode :
3251942
Title :
Fabrication and testing of vertical metal wedge devices with well defined gate to emitter separation
Author :
Fleming, J.G. ; Ohlberg, D.A.A. ; Felter, T. ; Malinowski, M.
Author_Institution :
Sandia Nat. Labs., Albuquerque, NM, USA
fYear :
1995
fDate :
July 30 1995-Aug. 3 1995
Firstpage :
257
Lastpage :
260
Abstract :
Cold cathode vacuum microelectronic devices typically consist of a sharp emitter tip, or wedge, separated from a gate by a micron or less, with an anode at a considerably greater separation. Our approach to the problem of fixing the emitter-to-grid separation relies not on photolithography, but rather on the thickness of a deposited conductive film, which is locally removed, to create the emitter-to-gate separation and, in some cases, a series resistor. Using this approach combined with integrated circuit fabrication techniques, we have been able to fabricate sharp wedge and tip emitters.
Keywords :
cold-cathode tubes; electron tube manufacture; vacuum microelectronics; cold cathode vacuum microelectronic devices; conductive film; emitter-to-gate separation; integrated circuit fabrication; series resistor; testing; tip emitter; vertical metal wedge devices; wedge emitter; Amorphous materials; Anodes; Conductive films; Conductivity; Fabrication; Resistors; Silicon; Sputter etching; Testing; Tin;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Vacuum Microelectronics Conference, 1995. IVMC., 1995 International
Conference_Location :
Portland, OR, USA
Print_ISBN :
0-7803-2143-X
Type :
conf
DOI :
10.1109/IVMC.1995.487043
Filename :
487043
Link To Document :
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