• DocumentCode
    3251942
  • Title

    Fabrication and testing of vertical metal wedge devices with well defined gate to emitter separation

  • Author

    Fleming, J.G. ; Ohlberg, D.A.A. ; Felter, T. ; Malinowski, M.

  • Author_Institution
    Sandia Nat. Labs., Albuquerque, NM, USA
  • fYear
    1995
  • fDate
    July 30 1995-Aug. 3 1995
  • Firstpage
    257
  • Lastpage
    260
  • Abstract
    Cold cathode vacuum microelectronic devices typically consist of a sharp emitter tip, or wedge, separated from a gate by a micron or less, with an anode at a considerably greater separation. Our approach to the problem of fixing the emitter-to-grid separation relies not on photolithography, but rather on the thickness of a deposited conductive film, which is locally removed, to create the emitter-to-gate separation and, in some cases, a series resistor. Using this approach combined with integrated circuit fabrication techniques, we have been able to fabricate sharp wedge and tip emitters.
  • Keywords
    cold-cathode tubes; electron tube manufacture; vacuum microelectronics; cold cathode vacuum microelectronic devices; conductive film; emitter-to-gate separation; integrated circuit fabrication; series resistor; testing; tip emitter; vertical metal wedge devices; wedge emitter; Amorphous materials; Anodes; Conductive films; Conductivity; Fabrication; Resistors; Silicon; Sputter etching; Testing; Tin;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vacuum Microelectronics Conference, 1995. IVMC., 1995 International
  • Conference_Location
    Portland, OR, USA
  • Print_ISBN
    0-7803-2143-X
  • Type

    conf

  • DOI
    10.1109/IVMC.1995.487043
  • Filename
    487043