DocumentCode :
3251993
Title :
Computer simulation of field emission for multilayer cathodes
Author :
Litovchenko, V.G. ; Kryuchenko, Yu.V.
Author_Institution :
Inst. of Semicond. Phys., Acad. of Sci., Kiev, Ukraine
fYear :
1995
fDate :
July 30 1995-Aug. 3 1995
Firstpage :
271
Abstract :
Summary form only given. High efficiency of field emission can be achieved using an effect of electron spectrum quantization in a thin metal film coated emitter surface. Another way to realize this mechanism is the development of systems with built-in quantum wells, in particular, delta-doped layers. Here we have considered the case of multilayer quantum size structures with the number of quantum wells N more than 1. It turned out that in this case current-field characteristics have many important peculiarities due to the additional effect of electron resonant tunneling through the structure. The influence of quantum well and barrier parameters on emission currents is analyzed for different N. The conditions for efficient field emission at low applied voltages are found. Computer calculations are made for a multilayer Si-SiO/sub 2/ structure with the thicknesses of quantum wells and barriers d=3-5 nm. Results of calculations are compared with experiment.
Keywords :
cathodes; electron field emission; semiconductor quantum wells; tunnelling; Si-SiO/sub 2/; computer simulation; current-field characteristics; delta-doped layers; electron resonant tunneling; electron spectrum quantization; field emission; multilayer cathode; quantum size structure; quantum wells; Cathodes; Coatings; Computer simulation; Electron emission; Nonhomogeneous media; Physics; Quantization; Quantum computing; Resonant tunneling devices; Semiconductor films;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Vacuum Microelectronics Conference, 1995. IVMC., 1995 International
Conference_Location :
Portland, OR, USA
Print_ISBN :
0-7803-2143-X
Type :
conf
DOI :
10.1109/IVMC.1995.487046
Filename :
487046
Link To Document :
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