• DocumentCode
    3252149
  • Title

    Electron field emission from chemical vapor deposited diamond

  • Author

    Zhu, W. ; Kochanski, G.P. ; Jin, S. ; Seibles, L.

  • Author_Institution
    AT&T Bell Labs., Murray Hill, NJ, USA
  • fYear
    1995
  • fDate
    July 30 1995-Aug. 3 1995
  • Firstpage
    300
  • Lastpage
    304
  • Abstract
    Diamond has recently emerged as a desirable material for field emitters due to its negative electron affinity and robust mechanical and chemical properties. This study identifies structural properties which govern the electron field emission process from undoped diamond. Desirable low-voltage diamond field emitters with such properties have been synthesized by controlling various CVD process parameters.
  • Keywords
    chemical vapour deposition; diamond; electron affinity; electron field emission; elemental semiconductors; semiconductor thin films; vacuum microelectronics; C; CVD process parameters; chemical vapor deposition; diamond; electron field emission; low-voltage field emitters; negative electron affinity; structural properties; vacuum microelectronics; Chemical vapor deposition; Electron emission; Equations; Fabrication; Field emitter arrays; Mechanical factors; Probes; Robustness; Size control; Surface reconstruction;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vacuum Microelectronics Conference, 1995. IVMC., 1995 International
  • Conference_Location
    Portland, OR, USA
  • Print_ISBN
    0-7803-2143-X
  • Type

    conf

  • DOI
    10.1109/IVMC.1995.487054
  • Filename
    487054