Abstract :
Start of the above-titled section of the conference proceedings record.
Keywords :
CMOS technology; Circuits; Information technology; Laboratories; MOSFETs; Materials science and technology; Microelectronics; Strain measurement; Substrates; Transistors;
Conference_Titel :
International SOI Conference, 2006 IEEE
Conference_Location :
Niagara Falls, NY
Print_ISBN :
1-4244-0289-1
DOI :
10.1109/SOI.2006.284424
