Collecting and Analyzing the Intensity Distribution of Diffraction by Computer

Traditional method of measuring intensity distribution of diffraction (screw-driven photocell method) causes big error. This paper introduced principle, experimental devices and requirements for adjustment of collecting intensity distribution of diffraction by CCD apparatus. The distribution curves of the single-slit and double-slit diffraction with different slit-width are obtained. The relative light intensity and relative light intensity distribution of them are calculated. Compared with the theoretical value, the relative errors are obtained.