DocumentCode
3252661
Title
Field emission from GaAs pyramids fabricated using selected area vapor phase epitaxy
Author
Shaw, J.L. ; Sillmon, R.S. ; Gray, H.F. ; Park, D.
Author_Institution
Naval Res. Lab., Washington, DC, USA
fYear
1995
fDate
July 30 1995-Aug. 3 1995
Firstpage
408
Lastpage
412
Abstract
We report the fabrication of GaAs pyramids using selected area organometallic vapor phase epitaxy (SA-OMVPE) and field emission characteristics obtained from these structures. The use of crystal planes to define structure surfaces offers an attractive way of fabricating atomically sharp tip apexes in field emitter arrays (FEAs). For example, diamond crystals typically form such sharp apex structures. To use crystal structures as field emitters in a FEA, the orientation and size of the crystal surfaces must be controllable and consistent over the array, and the crystal should have electronic properties compatible with field emission. When high transconductance or high emission currents are required, these electronic properties should include a low resistance electron injecting contact, high bulk conductivity, and a modest surface potential barrier for electron field emission. In addition, formation of the tip structure must be compatible with formation of an adequate gate aperture. III-V semiconductor crystals grown by SA-OMVPE may provide a material and fabrication system capable of satisfying all these requirements.
Keywords
III-V semiconductors; electron field emission; gallium arsenide; semiconductor epitaxial layers; semiconductor growth; vacuum microelectronics; vapour phase epitaxial growth; FEAs; GaAs; atomically sharp tip apexes; bulk conductivity; electron injecting contact; electronic properties; emission currents; field emission characteristics; field emitter arrays; gate aperture; organometallic vapor phase epitaxy; selected area vapor phase epitaxy; structure surfaces; surface potential barrier; transconductance; Atomic layer deposition; Crystals; Electron emission; Epitaxial growth; Fabrication; Field emitter arrays; Gallium arsenide; III-V semiconductor materials; Size control; Surface resistance;
fLanguage
English
Publisher
ieee
Conference_Titel
Vacuum Microelectronics Conference, 1995. IVMC., 1995 International
Conference_Location
Portland, OR, USA
Print_ISBN
0-7803-2143-X
Type
conf
DOI
10.1109/IVMC.1995.487077
Filename
487077
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