• DocumentCode
    3252661
  • Title

    Field emission from GaAs pyramids fabricated using selected area vapor phase epitaxy

  • Author

    Shaw, J.L. ; Sillmon, R.S. ; Gray, H.F. ; Park, D.

  • Author_Institution
    Naval Res. Lab., Washington, DC, USA
  • fYear
    1995
  • fDate
    July 30 1995-Aug. 3 1995
  • Firstpage
    408
  • Lastpage
    412
  • Abstract
    We report the fabrication of GaAs pyramids using selected area organometallic vapor phase epitaxy (SA-OMVPE) and field emission characteristics obtained from these structures. The use of crystal planes to define structure surfaces offers an attractive way of fabricating atomically sharp tip apexes in field emitter arrays (FEAs). For example, diamond crystals typically form such sharp apex structures. To use crystal structures as field emitters in a FEA, the orientation and size of the crystal surfaces must be controllable and consistent over the array, and the crystal should have electronic properties compatible with field emission. When high transconductance or high emission currents are required, these electronic properties should include a low resistance electron injecting contact, high bulk conductivity, and a modest surface potential barrier for electron field emission. In addition, formation of the tip structure must be compatible with formation of an adequate gate aperture. III-V semiconductor crystals grown by SA-OMVPE may provide a material and fabrication system capable of satisfying all these requirements.
  • Keywords
    III-V semiconductors; electron field emission; gallium arsenide; semiconductor epitaxial layers; semiconductor growth; vacuum microelectronics; vapour phase epitaxial growth; FEAs; GaAs; atomically sharp tip apexes; bulk conductivity; electron injecting contact; electronic properties; emission currents; field emission characteristics; field emitter arrays; gate aperture; organometallic vapor phase epitaxy; selected area vapor phase epitaxy; structure surfaces; surface potential barrier; transconductance; Atomic layer deposition; Crystals; Electron emission; Epitaxial growth; Fabrication; Field emitter arrays; Gallium arsenide; III-V semiconductor materials; Size control; Surface resistance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vacuum Microelectronics Conference, 1995. IVMC., 1995 International
  • Conference_Location
    Portland, OR, USA
  • Print_ISBN
    0-7803-2143-X
  • Type

    conf

  • DOI
    10.1109/IVMC.1995.487077
  • Filename
    487077