DocumentCode

3252753

Title

Device Physics and Modeling

fYear

2006

fDate

Oct. 2006

Firstpage

90

Lastpage

90

Keywords

Analytical models; CMOS technology; Electronic components; FinFETs; History; Industrial electronics; MOSFETs; Physics; Research and development; TV;

fLanguage

English

Publisher

ieee

Conference_Titel

International SOI Conference, 2006 IEEE

Conference_Location

Niagara Falls, NY, USA

ISSN

1078-621X

Print_ISBN

1-4244-0290-5

Electronic_ISBN

1078-621X

Type

conf

DOI

10.1109/SOI.2006.284447

Filename

4062895