Title :
Stochastic analog-to-digital conversion
Author :
Ceballos, José Luis ; Galton, Ian ; Temes, Gabor C.
Author_Institution :
Sch. of Electr. Eng. & Comput. Sci., Oregon State Univ., Corvallis, OR, USA
Abstract :
This paper suggests a stochastic approach to data conversion. It is applicable to serial, parallel, two-step as well as delta-sigma ADCs and DACs. In the serial implementation of this scheme, a sample-and-hold circuit, a noise source and a comparator are combined with an accumulate-and-dump digital stage to perform serial multibit A/D conversion. In the parallel ADC, M nominally identical primitive converter cells with the same input signal, x(t), but with different and uncorrelated random dither signals, di(t) (i = 1, 2, ..., M), are combined to perform the data conversion. Possible combination of the two methodologies is also outlined.
Keywords :
sample and hold circuits; sigma-delta modulation; stochastic processes; accumulate-and-dump digital stage; data conversion; noise source; sample-and-hold circuit; stochastic analog-to-digital conversion; Analog-digital conversion; Computer science; Counting circuits; Data conversion; Drives; Noise reduction; Quantization; Signal to noise ratio; Stochastic processes; Stochastic resonance;
Conference_Titel :
Circuits and Systems, 2005. 48th Midwest Symposium on
Print_ISBN :
0-7803-9197-7
DOI :
10.1109/MWSCAS.2005.1594236