DocumentCode
3253387
Title
Back-Gate Controlled Wide Tunable Range Diode Voltage in Asymmetrical Double-Gate Devices
Author
Kim, Keunwoo ; Chuang, Ching-Te ; Kuang, Jente B. ; Ngo, Hung C. ; Nowka, Kevin J.
Author_Institution
IBM T.J. Watson Res. Center, Yorktown Heights, NY
fYear
2006
fDate
2-5 Oct. 2006
Firstpage
151
Lastpage
152
Abstract
An area-efficient wide tunable range diode voltage technique was proposed using back-gate controlled asymmetrical DG device. Examples for power gating in latches and SRAMs, and dynamic supply for SRAM read/write, were discussed and validated by mix-mode simulations. Due to the wide range of achievable supply voltage in the proposed scheme, it can be used in VLSI logic/SRAM applications including dynamic VDD for logic, voltage islands, power gating, separate VDD for logic and SRAM, SRAM with a sleep transistor, and dynamic VDD for SRAM read/write
Keywords
MOSFET; SRAM chips; VLSI; semiconductor diodes; SRAM applications; SRAM read/write; VLSI logic applications; asymmetrical double-gate devices; back-gate controlled asymmetrical DG device; dynamic VDD; mix-mode simulations; power gating; sleep transistor; wide tunable range diode voltage technique; Clamps; Diodes; Frequency; Latches; Logic circuits; Logic devices; Random access memory; Threshold voltage; Tunable circuits and devices; Voltage control;
fLanguage
English
Publisher
ieee
Conference_Titel
International SOI Conference, 2006 IEEE
Conference_Location
Niagara Falls, NY
ISSN
1078-621X
Print_ISBN
1-4244-0289-1
Electronic_ISBN
1078-621X
Type
conf
DOI
10.1109/SOI.2006.284481
Filename
4062929
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