• DocumentCode
    3253387
  • Title

    Back-Gate Controlled Wide Tunable Range Diode Voltage in Asymmetrical Double-Gate Devices

  • Author

    Kim, Keunwoo ; Chuang, Ching-Te ; Kuang, Jente B. ; Ngo, Hung C. ; Nowka, Kevin J.

  • Author_Institution
    IBM T.J. Watson Res. Center, Yorktown Heights, NY
  • fYear
    2006
  • fDate
    2-5 Oct. 2006
  • Firstpage
    151
  • Lastpage
    152
  • Abstract
    An area-efficient wide tunable range diode voltage technique was proposed using back-gate controlled asymmetrical DG device. Examples for power gating in latches and SRAMs, and dynamic supply for SRAM read/write, were discussed and validated by mix-mode simulations. Due to the wide range of achievable supply voltage in the proposed scheme, it can be used in VLSI logic/SRAM applications including dynamic VDD for logic, voltage islands, power gating, separate VDD for logic and SRAM, SRAM with a sleep transistor, and dynamic VDD for SRAM read/write
  • Keywords
    MOSFET; SRAM chips; VLSI; semiconductor diodes; SRAM applications; SRAM read/write; VLSI logic applications; asymmetrical double-gate devices; back-gate controlled asymmetrical DG device; dynamic VDD; mix-mode simulations; power gating; sleep transistor; wide tunable range diode voltage technique; Clamps; Diodes; Frequency; Latches; Logic circuits; Logic devices; Random access memory; Threshold voltage; Tunable circuits and devices; Voltage control;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    International SOI Conference, 2006 IEEE
  • Conference_Location
    Niagara Falls, NY
  • ISSN
    1078-621X
  • Print_ISBN
    1-4244-0289-1
  • Electronic_ISBN
    1078-621X
  • Type

    conf

  • DOI
    10.1109/SOI.2006.284481
  • Filename
    4062929