• DocumentCode
    3253785
  • Title

    Toward Intelligent Software Defect Detection - Learning Software Defects by Example

  • Author

    Benson, Markland J.

  • Author_Institution
    Software Eng. Div., NASA Goddard Space Flight Center, Greenbelt, MD, USA
  • fYear
    2011
  • fDate
    20-21 June 2011
  • Firstpage
    138
  • Lastpage
    142
  • Abstract
    Source code level software defect detection has gone from state of the art to a software engineering best practice. Automated code analysis tools streamline many of the aspects of formal code inspections but have the drawback of being difficult to construct and either prone to false positives or severely limited in the set of defects that can be detected. Machine learning technology provides the promise of learning software defects by example, easing construction of detectors and broadening the range of defects that can be found. Pinpointing software defects with the same level of granularity as prominent source code analysis tools distinguishes this research from past efforts, which focused on analyzing software engineering metrics data with granularity limited to that of a particular function rather than a line of code.
  • Keywords
    learning (artificial intelligence); program diagnostics; software metrics; automated code analysis tool; formal code inspection; intelligent software defect detection; machine learning; software engineering metrics; source code level software defect detection; Feature extraction; Machine learning; Measurement; Presses; Software; Software engineering; Training;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Software Engineering Workshop (SEW), 2011 34th IEEE
  • Conference_Location
    Limerick
  • ISSN
    1550-6215
  • Print_ISBN
    978-1-4673-0245-6
  • Type

    conf

  • DOI
    10.1109/SEW.2011.26
  • Filename
    6146920