DocumentCode :
3254116
Title :
A survey on defect and noise detection and correction algorithms in image sensors
Author :
Jain, Abhishek ; Gupta, Richa
Author_Institution :
ECE Dept., Jaypee Inst. of Inf. Technol., Noida, India
fYear :
2015
fDate :
19-20 March 2015
Firstpage :
754
Lastpage :
759
Abstract :
This paper presents a survey on various novel defect and noise detection and correction algorithms used in CMOS image sensors. This class of sensors is extremely relevant in number of applications in the areas of gaming, security, medical, automotive, high-end camera market, etc. This survey outlines the algorithms and the hardware implementation of novel defect and noise detection and correction schemes to detect and correct defective pixels, and discusses their performance and advantages in terms of their applications. Experimental results on various images illustrate the capabilities of the studied approaches.
Keywords :
CMOS image sensors; fault diagnosis; image denoising; CMOS image sensor; correction algorithm; defect detection; defective pixel correction; hardware implementation; noise detection; Algorithm design and analysis; Image sensors; Kernel; Noise; Sensors; Shape; Signal processing algorithms; Image sensors; defect correction; defect detection; noise reduction;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer Engineering and Applications (ICACEA), 2015 International Conference on Advances in
Conference_Location :
Ghaziabad
Type :
conf
DOI :
10.1109/ICACEA.2015.7164803
Filename :
7164803
Link To Document :
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