Title :
An On-Chip Measurement Circuit for Calibration by Combination Selection
Author :
Maunu, Janne ; Marku, Joona ; Laiho, Mika ; Paasio, Ari
Author_Institution :
Dept. of Inf. Technol., Univ. of Turku, Turku
Abstract :
We present an on-chip measurement circuit for current source calibration by combination selection in current and future CMOS technologies. The circuit evaluates the output current values and selects a current that ensures 99% mismatch compensation accuracy with 4 sigma yield.
Keywords :
CMOS integrated circuits; calibration; electric current measurement; integrated circuit measurement; CMOS technologies; combination selection; current source calibration; mismatch compensation accuracy; on-chip current measurement circuit; CMOS technology; Calibration; Computer science; Counting circuits; Current measurement; Information technology; Laboratories; Microelectronics; Mirrors; Switches;
Conference_Titel :
SOC Conference, 2006 IEEE International
Conference_Location :
Taipei
Print_ISBN :
0-7803-9781-9
Electronic_ISBN :
0-7803-9782-7
DOI :
10.1109/SOCC.2006.283844
