Title :
Crosstalk in ultra-high-speed VLSI interconnects due to substrate-conductivity, temperature, and line-length effects
Author :
Malisuwan, Settapong
Author_Institution :
Dept. of Electr. Eng., Florida Atlantic Univ., Boca Raton, FL, USA
Abstract :
Effects of substrate-conductivity, temperature, and line-length on crosstalk along ultra-high-speed VLSI interconnects are investigated. Results indicate that the crosstalk does not decrease monotonically with increasing linespacing and also the crosstalk tends to be more oscillatory when the line-length is increased. The crosstalk amplitude is significantly changed when temperature is varied between 265 to 280 Kelvin for 10-50 mm line-length. Furthermore, the crosstalk is eliminated when substrate-conductivity is greater than 0.14 Siemen/meter and temperature is less than 265 K
Keywords :
VLSI; crosstalk; integrated circuit interconnections; very high speed integrated circuits; 10 to 50 mm; 265 to 280 K; crosstalk; line length; substrate conductivity; temperature dependence; ultra-high-speed VLSI interconnect; Crosstalk; Electromagnetic interference; Frequency; Impedance; Integrated circuit interconnections; Microstrip; Permittivity; Temperature; Transmission line theory; Very large scale integration;
Conference_Titel :
Communications, Computers and Signal Processing, 1999 IEEE Pacific Rim Conference on
Conference_Location :
Victoria, BC
Print_ISBN :
0-7803-5582-2
DOI :
10.1109/PACRIM.1999.799505