• DocumentCode
    3254312
  • Title

    Supply and Threshold Voltage Optimization for Temperature Variation Insensitive Circuit Performance: A Comparison

  • Author

    Kumar, Ranjith ; Kursun, Volkan

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of Wisconsin -Madison, Madison, WI
  • fYear
    2006
  • fDate
    24-27 Sept. 2006
  • Firstpage
    89
  • Lastpage
    90
  • Abstract
    In this paper, the supply and threshold voltage optimization techniques to achieve temperature variation insensitive circuit performance are compared. The speed and energy tradeoffs with the two optimization techniques are presented.
  • Keywords
    CMOS integrated circuits; circuit optimisation; electric potential; integrated circuit design; integrated circuit testing; CMOS technology; design methodologies; energy tradeoffs; speed aspects; supply voltage optimization; temperature variation insensitive circuit performance; threshold voltage optimization techniques; CMOS technology; Circuit optimization; Current supplies; Degradation; Fluctuations; Intrusion detection; MOSFET circuits; Propagation delay; Temperature sensors; Threshold voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    SOC Conference, 2006 IEEE International
  • Conference_Location
    Taipei
  • Print_ISBN
    0-7803-9781-9
  • Electronic_ISBN
    0-7803-9782-7
  • Type

    conf

  • DOI
    10.1109/SOCC.2006.283852
  • Filename
    4063021