DocumentCode :
3254312
Title :
Supply and Threshold Voltage Optimization for Temperature Variation Insensitive Circuit Performance: A Comparison
Author :
Kumar, Ranjith ; Kursun, Volkan
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Wisconsin -Madison, Madison, WI
fYear :
2006
fDate :
24-27 Sept. 2006
Firstpage :
89
Lastpage :
90
Abstract :
In this paper, the supply and threshold voltage optimization techniques to achieve temperature variation insensitive circuit performance are compared. The speed and energy tradeoffs with the two optimization techniques are presented.
Keywords :
CMOS integrated circuits; circuit optimisation; electric potential; integrated circuit design; integrated circuit testing; CMOS technology; design methodologies; energy tradeoffs; speed aspects; supply voltage optimization; temperature variation insensitive circuit performance; threshold voltage optimization techniques; CMOS technology; Circuit optimization; Current supplies; Degradation; Fluctuations; Intrusion detection; MOSFET circuits; Propagation delay; Temperature sensors; Threshold voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
SOC Conference, 2006 IEEE International
Conference_Location :
Taipei
Print_ISBN :
0-7803-9781-9
Electronic_ISBN :
0-7803-9782-7
Type :
conf
DOI :
10.1109/SOCC.2006.283852
Filename :
4063021
Link To Document :
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