DocumentCode :
3254579
Title :
Multi-Project System-on-Chip (MP-SoC): A Novel Test Vehicle for SoC Silicon Prototyping
Author :
Huang, Chun-Ming ; Lee, Kuen-Jong ; Yang, Chih-Chyau ; Hu, Wen-Hsiang ; Wang, Shi-Shen ; Chen, Jeng-Bin ; Chen, Chi-Shi ; Van, Lan-Da ; Wu, Chien-Ming ; Tsai, Wei-Chang ; Jou, Jing-Yang
Author_Institution :
Nat. Chip Implementation Center (CIC), Nat. Appl. Res. Labs., Hsinchu
fYear :
2006
fDate :
24-27 Sept. 2006
Firstpage :
137
Lastpage :
140
Abstract :
In this paper, we propose a novel SoC design methodology referred to as multi-project system-on-a-chip (MP-SoC), which can integrate multiple heterogeneous SoC design projects into a single chip such that the total silicon prototyping cost for these projects can be greatly reduced due to the sharing of a common SoC platform. The design flows for the system architecture, individual IP blocks, as well as the logic and physical implementations of MP-SoC are explored. The isolation mechanism to prevent interference among the IPs and the arbitration mechanism to grant the bus usage for master IPs are also presented. A test chip named MP-SoC-l that includes 8 SoC projects from 4 universities was selected as a demonstration example for verifying the MP-SoC design concept. This chip is designed and implemented in TSMC 0.13 mum CMOS generic logic process technology, and the total silicon area for MP-SoC-l test chip is 4950 mum x 4938 mum. Experimental results of MP-SoC-l test chip show that all projects are successfully implemented in the common platform and 82.91% silicon area is saved with this MP- SoC methodology as compared with the case where multiple SoC projects are fabricated individually.
Keywords :
CMOS logic circuits; integrated circuit design; system-on-chip; MP-SoC-l; TSMC CMOS generic logic process technology; arbitration mechanism; individual IP blocks; logic implementations; multiproject system-on-chip design; physical implementations; size 0.13 mum; system architecture; system-on-chip silicon prototyping; test vehicle; Costs; Design methodology; Interference; Logic design; Logic testing; Prototypes; Silicon; System testing; System-on-a-chip; Vehicles;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
SOC Conference, 2006 IEEE International
Conference_Location :
Taipei
Print_ISBN :
0-7803-9781-9
Electronic_ISBN :
0-7803-9782-7
Type :
conf
DOI :
10.1109/SOCC.2006.283867
Filename :
4063036
Link To Document :
بازگشت