• DocumentCode
    3254610
  • Title

    The Analysis of Photoresist´s Absorption Spectrum by THz-TDS

  • Author

    Wang Xueguang ; Lang Liying

  • Author_Institution
    Coll. of Inf. & Electr. Eng., Hebei Univ. of Eng., Handan, China
  • fYear
    2009
  • fDate
    14-16 Aug. 2009
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Using terahertz time domain spectroscopy (THz-TDS), the photoresist´s absorption spectrum was measured in this paper. From the experimental data, A significant difference was found in the absorption between the exposure and unexposure photoresist. And we also discuss the requirements to sample preparation imposed by the lack of sharp spectral features in the absorption specra. The experimental results show that the THz-TDS is useful to measure the material spectra and can be effective to analysis their character.
  • Keywords
    photoresists; terahertz wave spectra; time resolved spectra; exposure photoresist; material spectra; photoresist absorption spectrum; terahertz time domain spectroscopy; unexposure photoresist; Biological materials; Electromagnetic radiation; Electromagnetic wave absorption; Electron beams; Ion beams; Resists; Semiconductor materials; Spectroscopy; Time measurement; X-ray lasers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photonics and Optoelectronics, 2009. SOPO 2009. Symposium on
  • Conference_Location
    Wuhan
  • Print_ISBN
    978-1-4244-4412-0
  • Type

    conf

  • DOI
    10.1109/SOPO.2009.5230286
  • Filename
    5230286