DocumentCode
3254610
Title
The Analysis of Photoresist´s Absorption Spectrum by THz-TDS
Author
Wang Xueguang ; Lang Liying
Author_Institution
Coll. of Inf. & Electr. Eng., Hebei Univ. of Eng., Handan, China
fYear
2009
fDate
14-16 Aug. 2009
Firstpage
1
Lastpage
4
Abstract
Using terahertz time domain spectroscopy (THz-TDS), the photoresist´s absorption spectrum was measured in this paper. From the experimental data, A significant difference was found in the absorption between the exposure and unexposure photoresist. And we also discuss the requirements to sample preparation imposed by the lack of sharp spectral features in the absorption specra. The experimental results show that the THz-TDS is useful to measure the material spectra and can be effective to analysis their character.
Keywords
photoresists; terahertz wave spectra; time resolved spectra; exposure photoresist; material spectra; photoresist absorption spectrum; terahertz time domain spectroscopy; unexposure photoresist; Biological materials; Electromagnetic radiation; Electromagnetic wave absorption; Electron beams; Ion beams; Resists; Semiconductor materials; Spectroscopy; Time measurement; X-ray lasers;
fLanguage
English
Publisher
ieee
Conference_Titel
Photonics and Optoelectronics, 2009. SOPO 2009. Symposium on
Conference_Location
Wuhan
Print_ISBN
978-1-4244-4412-0
Type
conf
DOI
10.1109/SOPO.2009.5230286
Filename
5230286
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