Title :
Frequency domain identification of Hammerstein systems
Author :
Wain, A. ; Westwick, David T. ; Perreault, Eric J.
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Auckland, Auckland, New Zealand
Abstract :
The present study proposes a new approach to identify the parameters of both continuous and discrete time Hammerstein systems in frequency domain. A harmonic probing technique is used to derive the linear and higher-order frequency response functions (called the generalized frequency response functions (GFRF)) of both discrete and continuous-time Hammerstein models. The computation of the n-th order generalized frequency response functions (GFRF) is a recursive procedure where each lower order GFRF contains no effects from higher order terms. Thus the parameter estimation problem can be formulated in a linear least squares framework where the parameters corresponding to nonlinearities of different orders can be estimated independently, beginning with first order and then building up to include the nonlinear terms using the weighted complex orthogonal estimator, which is a modified version of the standard orthogonal least squares, to accommodate complex data. Simulation results are included to demonstrate that the proposed method can successfully estimate the parameters of the system under the effects of significant levels of noise.
Keywords :
continuous time systems; discrete time systems; frequency-domain analysis; least squares approximations; nonlinear control systems; parameter estimation; Hammerstein systems; continuous time system; discrete time system; frequency domain identification; generalized frequency response function; harmonic probing technique; linear least squares framework; parameter estimation; weighted complex orthogonal estimator; Biomedical engineering; Convergence; Frequency domain analysis; Frequency estimation; Frequency response; Least squares approximation; Least squares methods; Nonlinear dynamical systems; Nonlinear systems; Parameter estimation;
Conference_Titel :
TENCON 2009 - 2009 IEEE Region 10 Conference
Conference_Location :
Singapore
Print_ISBN :
978-1-4244-4546-2
Electronic_ISBN :
978-1-4244-4547-9
DOI :
10.1109/TENCON.2009.5395973