• DocumentCode
    325511
  • Title

    EM scattering by an interior right-angled anisotropic impedance wedge illuminated at oblique incidence

  • Author

    Manara, G. ; Nepa, P. ; Pelosi, G.

  • Author_Institution
    Dept. of Inf. Eng., Pisa Univ., Italy
  • Volume
    3
  • fYear
    1998
  • fDate
    21-26 June 1998
  • Firstpage
    1553
  • Abstract
    The aim of this paper is to derive an approximate analytical solution for skew incidence scattering from an interior right-angled anisotropic impedance wedge. This is obtained by resorting to a perturbation technique based on the Sommerfeld-Maliuzhinets method, considering the perfectly conducting case as the unperturbed configuration. This approximate perturbative solution has been validated by analytically comparing the expressions obtained with the corresponding relationships presented by Senior (1973). The solution of Senior is again derived in the framework of a perturbative approach (the small parameter in both solutions consists of the normalized surface impedance), although making use of the two-dimensional Green´s function instead of the Sommerfeld-Maliuzhinets representation utilized here. In order to improve the accuracy, a third order term has been included in calculations in the present approach, at the cost of a slight increase in analytical and computational complexity.
  • Keywords
    Green´s function methods; electric impedance; electromagnetic wave scattering; EM scattering; Sommerfeld-Maliuzhinets method; computational complexity; interior right-angled anisotropic impedance wedge; oblique incidence; perfectly conducting case; perturbation technique; skew incidence scattering; two-dimensional Green´s function; unperturbed configuration; Anisotropic magnetoresistance; Boundary conditions; Conducting materials; Geometrical optics; Geometry; Optical scattering; Optical surface waves; Optical waveguides; Surface impedance; Tensile stress;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Antennas and Propagation Society International Symposium, 1998. IEEE
  • Conference_Location
    Atlanta, GA, USA
  • Print_ISBN
    0-7803-4478-2
  • Type

    conf

  • DOI
    10.1109/APS.1998.690843
  • Filename
    690843