DocumentCode :
3255486
Title :
The effects of void presence on the tree growth phenomena
Author :
Coletti, G. ; Gemme, C. ; Curinga, L. ; Verganelli, G.
Author_Institution :
Dept. of Electr. Eng., Genoa Univ., Italy
fYear :
1995
fDate :
10-13 Jul 1995
Firstpage :
487
Lastpage :
492
Abstract :
The ethylene vinyl acetate (EVA) compound has been chosen for this study because of its transparency and because it allows on to obtain a low percentage of rejects during the moulding procedure. Therefore this work was focused on the influence of artificial voids at the tip of needle electrodes on the parameters characterizing treeing inception and growth, usually considered when comparing different materials. It is worth noting here that in real insulation, dielectric strength and ageing endurance are features which generally do not directly and always depend on the presence of voids, as the latter generally are dispersed in an unknown way into the bulk or at the interfaces of the insulation. Therefore the presented findings, although interesting for material characterization, cannot be directly used for actual insulation evaluation
Keywords :
ageing; electric strength; insulation testing; polyethylene insulation; polymer structure; trees (electrical); voids (solid); EVA; ageing endurance; artificial voids; dielectric strength; ethylene vinyl acetate; moulding procedure; needle electrodes; polymer tips; real insulation; rejects; transparency; tree growth phenomena; treeing inception; void; Breakdown voltage; Conducting materials; Dielectrics and electrical insulation; Electrodes; Materials testing; Needles; Nonuniform electric fields; Performance evaluation; Semiconductor materials; Trees - insulation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Conduction and Breakdown in Solid Dielectrics, 1995. ICSD'95., Proceedings of the 1995 IEEE 5th International Conference on
Conference_Location :
Leicester
Print_ISBN :
0-7803-2040-9
Type :
conf
DOI :
10.1109/ICSD.1995.523034
Filename :
523034
Link To Document :
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