Title :
Modelling of the influence of the layer pollution thickness in high voltage polluted insulators
Author :
Prado, A. J do ; Astorga, O.A.M.
Author_Institution :
Dept. of Electr. Eng., Sao Paulo Univ., Brazil
Abstract :
This paper presents an experimental model and a mathematical model with the introduction of a ramp in the channel of the Obenaus model. The objective is to present a better reproduction of the real layer pollution deposited on the HV insulators. This reproduction was obtained from two types of thickness variation: the introduction of a ramp (soft variation) and the introduction of a step (sudden variation)
Keywords :
flashover; high-voltage techniques; insulator contamination; HV insulators; Obenaus model; channel; experimental model; flashover; high voltage polluted insulators; layer pollution thickness; mathematical model; modelling; ramp; step variation; thickness variation; Circuits; Computational modeling; Flashover; Insulation; Mathematical model; Solid modeling; Surface contamination; Voltage; Water pollution; Wire;
Conference_Titel :
Conduction and Breakdown in Solid Dielectrics, 1995. ICSD'95., Proceedings of the 1995 IEEE 5th International Conference on
Conference_Location :
Leicester
Print_ISBN :
0-7803-2040-9
DOI :
10.1109/ICSD.1995.523038
