• DocumentCode
    3255557
  • Title

    Modelling of the influence of the layer pollution thickness in high voltage polluted insulators

  • Author

    Prado, A. J do ; Astorga, O.A.M.

  • Author_Institution
    Dept. of Electr. Eng., Sao Paulo Univ., Brazil
  • fYear
    1995
  • fDate
    10-13 Jul 1995
  • Firstpage
    508
  • Lastpage
    512
  • Abstract
    This paper presents an experimental model and a mathematical model with the introduction of a ramp in the channel of the Obenaus model. The objective is to present a better reproduction of the real layer pollution deposited on the HV insulators. This reproduction was obtained from two types of thickness variation: the introduction of a ramp (soft variation) and the introduction of a step (sudden variation)
  • Keywords
    flashover; high-voltage techniques; insulator contamination; HV insulators; Obenaus model; channel; experimental model; flashover; high voltage polluted insulators; layer pollution thickness; mathematical model; modelling; ramp; step variation; thickness variation; Circuits; Computational modeling; Flashover; Insulation; Mathematical model; Solid modeling; Surface contamination; Voltage; Water pollution; Wire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Conduction and Breakdown in Solid Dielectrics, 1995. ICSD'95., Proceedings of the 1995 IEEE 5th International Conference on
  • Conference_Location
    Leicester
  • Print_ISBN
    0-7803-2040-9
  • Type

    conf

  • DOI
    10.1109/ICSD.1995.523038
  • Filename
    523038