DocumentCode :
3256161
Title :
The effects of on-chip and package decoupling capacitors and an efficient ASIC decoupling methodology
Author :
Na, Nanju ; Budell, Timothy ; Chiu, Charles ; Tremble, Eric ; Wemple, Ivan
Author_Institution :
IBM Microelectronics, Essex Junction, VT, USA
Volume :
1
fYear :
2004
fDate :
1-4 June 2004
Firstpage :
556
Abstract :
This paper presents an in-depth analysis of the effectiveness of on-chip and package decoupling capacitors in light of the interaction between chip-package resonance and the frequency content of switching sources, and suggests an approach for decoupling analysis in fast turn-around ASIC designs, achieving both simulation efficiency and accuracy. The analysis is based on accurate modeling of the on-chip and package power supply structures of ASIC flip-chip modules as distributed networks to provide precise understanding of switching noise mechanisms in distributed power supply structures in both the time and frequency domains. The simulation efficiency versus accuracy of two types of package models is discussed. The local effectiveness of on-chip and package decoupling capacitors is illustrated using detailed, frequency-domain impedance profiles of the on-chip and package power supply networks, demonstrating location-dependant responses that vary according to the local placement of decoupling capacitors. Based on the study, a methodology is presented for accurately determining the quantities and locations of on-chip decoupling capacitors required to limit on-chip transient power supply collapse to a pre-defined level.
Keywords :
application specific integrated circuits; circuit simulation; flip-chip devices; frequency-domain analysis; integrated circuit design; integrated circuit modelling; integrated circuit noise; integrated circuit packaging; power supply circuits; thin film capacitors; time-domain analysis; transient response; ASIC decoupling methodology; ASIC flip-chip modules; chip-package resonance; decoupling analysis; decoupling capacitor placement; distributed networks; distributed power supply structures; fast turn-around ASIC designs; frequency domain; location-dependant responses; modeling; on-chip decoupling capacitors; on-chip power supply structures; on-chip transient power supply collapse limit; package decoupling capacitors; package power supply structures; simulation accuracy; simulation efficiency; switching noise mechanisms; switching source frequency content interaction; time domain; Analytical models; Application specific integrated circuits; Frequency domain analysis; Impedance; Network-on-a-chip; Packaging; Power supplies; Resonance; Resonant frequency; Switched capacitor networks;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference, 2004. Proceedings. 54th
Print_ISBN :
0-7803-8365-6
Type :
conf
DOI :
10.1109/ECTC.2004.1319394
Filename :
1319394
Link To Document :
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