DocumentCode
325624
Title
Modeling the directional reflectance (BRDF) of a corrugated roof and experimental verification
Author
Meister, Gerhard ; Rothkirch, André ; Wiemker, Rafael ; Bienlein, Johann ; Spitzer, Hartwigsp
Author_Institution
II. Inst. fur Experimentalphys., Hamburg Univ., Germany
Volume
3
fYear
1998
fDate
6-10 Jul 1998
Firstpage
1487
Abstract
Remotely sensed images with a pixel size of about 1 m can nowadays be acquired by airborne scanners and in the near future also by high resolution satellites. With such a high spatial resolution, remotely sensed data of urban areas can resolve structures like a roof into the different surface segments with different inclinations, e.g. in the case of a gabled roof. The authors have measured the BRDF (bidirectional reflectance distribution function) effects thoroughly on a roof covered with corrugated (sinusoidally shaped) roof tiles and on a sample of flat roof tiles. They modeled the shape of the corrugated tiles by a cosine function and assumed that every infinitesimal surface patch of the roof tile has a BRDF proportional to the BRDF of the flat roof tile. Model results and measurements agree well. The most critical parameters are the ratio height over wavelength of the sinusoidal roof tiles and the intensity of the specular peak of the surface patch. It is possible to retrieve these parameters from the measurements
Keywords
geophysical techniques; light scattering; remote sensing; BRDF; bidirectional reflectance distribution function; building roof; corrugated roof; corrugated tile; directional reflectance; experimental verification; geophysical measurement technique; land surface; light scattering; model; optical imaging; remote sensing; specular peak; terrain mapping; urban area; Corrugated surfaces; Image resolution; Image segmentation; Pixel; Reflectivity; Satellites; Spatial resolution; Tiles; Urban areas; Wavelength measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Geoscience and Remote Sensing Symposium Proceedings, 1998. IGARSS '98. 1998 IEEE International
Conference_Location
Seattle, WA
Print_ISBN
0-7803-4403-0
Type
conf
DOI
10.1109/IGARSS.1998.691525
Filename
691525
Link To Document