Title :
An automatic evaluation of phase noise on CMOS ring VCOs
Author :
Wang, Lu ; Nunez, Adrian
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Syracuse Univ., NY
Abstract :
The presence of phase noise in semiconductor devices can disturb the normal operation of analog and RF circuits. This paper presents a methodology to automatically evaluate the effects of phase noise in ring voltage controlled oscillators (VCOs). The methodology is based on SPICE circuit simulations and a mathematical analysis. A CAD tool was implemented and used to evaluate and optimize a four-stage ring VCO to show the effectiveness of the methodology
Keywords :
CMOS integrated circuits; integrated circuit noise; phase noise; voltage-controlled oscillators; CMOS integrated circuits; RF circuits; SPICE circuit simulations; analog circuits; phase noise; ring VCO; semiconductor devices; voltage controlled oscillator; 1f noise; Bandwidth; Circuit noise; Circuit simulation; Frequency; Mathematical analysis; Phase noise; Semiconductor device noise; Voltage-controlled oscillators; Wireless communication;
Conference_Titel :
Circuits and Systems, 2005. 48th Midwest Symposium on
Conference_Location :
Covington, KY
Print_ISBN :
0-7803-9197-7
DOI :
10.1109/MWSCAS.2005.1594415
