DocumentCode
3256304
Title
An automatic evaluation of phase noise on CMOS ring VCOs
Author
Wang, Lu ; Nunez, Adrian
Author_Institution
Dept. of Electr. Eng. & Comput. Sci., Syracuse Univ., NY
fYear
2005
fDate
7-10 Aug. 2005
Firstpage
1569
Abstract
The presence of phase noise in semiconductor devices can disturb the normal operation of analog and RF circuits. This paper presents a methodology to automatically evaluate the effects of phase noise in ring voltage controlled oscillators (VCOs). The methodology is based on SPICE circuit simulations and a mathematical analysis. A CAD tool was implemented and used to evaluate and optimize a four-stage ring VCO to show the effectiveness of the methodology
Keywords
CMOS integrated circuits; integrated circuit noise; phase noise; voltage-controlled oscillators; CMOS integrated circuits; RF circuits; SPICE circuit simulations; analog circuits; phase noise; ring VCO; semiconductor devices; voltage controlled oscillator; 1f noise; Bandwidth; Circuit noise; Circuit simulation; Frequency; Mathematical analysis; Phase noise; Semiconductor device noise; Voltage-controlled oscillators; Wireless communication;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems, 2005. 48th Midwest Symposium on
Conference_Location
Covington, KY
Print_ISBN
0-7803-9197-7
Type
conf
DOI
10.1109/MWSCAS.2005.1594415
Filename
1594415
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